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System 1 – Scanning Electron Microscope.The instrument will be used primarily for imaging of geological materials (minerals, rocks, microfossils) and for qualitative to semiquantitative analysis of such objects.The instrument should be based on a field emission electron gun.Imaging capabilities should include:— A secondary electron imaging system,— A detection system for backscattered electrons with sufficient sensitivity and contrast to allow fast imaging of internal compositional variations in minerals, e.g. zoning patterns in magmatic zircon. This must be demonstrated by satisfactory images of zircon mounts provided by us,— A fast and sensitive multichannel detector system for cathodoluminescence imaging and wavelength analysis with high spatial and spectral resolution. The system must be applicable both to fast routine imaging of real colour variations in, for example, magmatic zircon, as well as to high-resolution imaging. Imaging capability must be demonstrated by satisfactory images of zircon mounts provided by us,— Capability for whole-thin-section mapping by automatic movement of the stage (minimum range 48 by 28 mm standard thin section).The instrument should be equipped with a cooling /heating stage capable of working at controlled temperatures between -185 oC and +200 oCThe instrument must be equipped with a Peltier-cooled energy dispersive X-ray spectrometer capable of quantitative as well as qualitative and semiquantitative chemical analysis.An electron backscatter diffraction detector system should be included as an optional item.System 2 – Transmission Electron MicroscopeThe microscope will be used mainly for studies of conventional resin-embedded samples as well as of fully-hydrated and also negatively stained specimens using the following techniques: low and high magnification imaging, medium to high resolution imaging (HREM), imaging at high angles for tomography, low dose imaging of radiation sensitive (cryo-) specimens and energy dispersive X-ray spectroscopy (EDS). We would also like to discuss the possibilities for STEM, phase-plate and energy-loss imaging.The supply of the transmission electron microscope shall consist of the following:a. Basic unit;b. LaB6 gun;c. Specimen holders: standard holder, high (double)-tilt and possibly rotary (tomography) holder as well as a cryo holder (including pumping station);d. Digital camera (about 4kX4k);e. EDS detector;f. All the necessary computer hardware;g. All the necessary software (incl. license fees);h. Closed circuit cooling system;i. Service contract;j. Training of personel;k. Exchange of the existing microscope;l. Possibility: STEM detector for tomography, phase-plate and possibilities for energy loss imaging.8 000 00012 000 000