Electron microscopic equipment

University of Oslo

Electron microscopic equipment.

Frist

Fristen for mottak av tilbud var 2014-06-06. Anskaffelsen ble publisert 2014-05-06.

Leverandører

Følgende leverandører er nevnt i tildelingsbeslutninger eller andre anskaffelsesdokumenter:

Hvem? Hva? Hvor?
Anskaffelseshistorikk
Dato Dokument
2014-05-06 Kunngjøring av konkurranse
2015-04-13 Kunngjøring om tildeling av kontrakt
Kunngjøring av konkurranse (2014-05-06)
Gjenstand
Anskaffelsens omfang
Tittel: Electron microscopes
Antall eller omfang:
System 1 – Scanning Electron Microscope.The instrument will be used primarily for imaging of geological materials (minerals, rocks, microfossils) and for qualitative to semiquantitative analysis of such objects.The instrument should be based on a field emission electron gun.Imaging capabilities should include:— A secondary electron imaging system,— A detection system for backscattered electrons with sufficient sensitivity and contrast to allow fast imaging of internal compositional variations in minerals, e.g. zoning patterns in magmatic zircon. This must be demonstrated by satisfactory images of zircon mounts provided by us,— A fast and sensitive multichannel detector system for cathodoluminescence imaging and wavelength analysis with high spatial and spectral resolution. The system must be applicable both to fast routine imaging of real colour variations in, for example, magmatic zircon, as well as to high-resolution imaging. Imaging capability must be demonstrated by satisfactory images of zircon mounts provided by us,— Capability for whole-thin-section mapping by automatic movement of the stage (minimum range 48 by 28 mm standard thin section).The instrument should be equipped with a cooling /heating stage capable of working at controlled temperatures between -185 oC and +200 oCThe instrument must be equipped with a Peltier-cooled energy dispersive X-ray spectrometer capable of quantitative as well as qualitative and semiquantitative chemical analysis.An electron backscatter diffraction detector system should be included as an optional item.System 2 – Transmission Electron MicroscopeThe microscope will be used mainly for studies of conventional resin-embedded samples as well as of fully-hydrated and also negatively stained specimens using the following techniques: low and high magnification imaging, medium to high resolution imaging (HREM), imaging at high angles for tomography, low dose imaging of radiation sensitive (cryo-) specimens and energy dispersive X-ray spectroscopy (EDS). We would also like to discuss the possibilities for STEM, phase-plate and energy-loss imaging.The supply of the transmission electron microscope shall consist of the following:a. Basic unit;b. LaB6 gun;c. Specimen holders: standard holder, high (double)-tilt and possibly rotary (tomography) holder as well as a cryo holder (including pumping station);d. Digital camera (about 4kX4k);e. EDS detector;f. All the necessary computer hardware;g. All the necessary software (incl. license fees);h. Closed circuit cooling system;i. Service contract;j. Training of personel;k. Exchange of the existing microscope;l. Possibility: STEM detector for tomography, phase-plate and possibilities for energy loss imaging.8 000 00012 000 000
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Metadata for kunngjøring
Originalspråk: engelsk 🗣️
Dokumenttype: Kunngjøring av konkurranse
Kontraktens art: Varer
Forskrift: Det europeiske økonomiske samarbeidsområdet (EØS), med deltakelse av GPA-land
Felles innkjøpsordliste (CPV)
Kode: Elektronmikroskoper 📦

Prosedyre
Prosedyretype: Konkurransepreget dialog
Tilbudstype: Innlevering for alle delkontrakter
Tildelingskriterier
Det mest økonomisk fordelaktige tilbudet

Oppdragsgiver
Identitet
Land: Norge 🇳🇴
Type tildelende myndighet: Nasjonalt eller føderalt byrå/kontor
Navn på tildelende myndighet: University of Oslo
Postadresse: Faculty of Mathematics and Natural Sciences, P.O.Box 1032 Blindern
Postnummer: 0315
Poststed: Oslo
Kontakt
E-post: innkjop-matnat@mn.uio.no 📧
Telefon: +47 22857092 📞

Referanse
Datoer
Sendt dato: 2014-05-06 📅
Innleveringsfrist: 2014-06-06 📅
Publiseringsdato: 2014-05-08 📅
Identifikatorer
Kunngjøringsnummer: 2014/S 089-156117
OJ-S-utgave: 89

Gjenstand
Anskaffelsens omfang
Kort beskrivelse: Electron microscopic equipment.
Varianter vil bli akseptert ✅
Antall eller omfang:
System 1 – Scanning Electron Microscope.
The instrument will be used primarily for imaging of geological materials (minerals, rocks, microfossils) and for qualitative to semiquantitative analysis of such objects.
The instrument should be based on a field emission electron gun.
Imaging capabilities should include:
— A secondary electron imaging system,
— A detection system for backscattered electrons with sufficient sensitivity and contrast to allow fast imaging of internal compositional variations in minerals, e.g. zoning patterns in magmatic zircon. This must be demonstrated by satisfactory images of zircon mounts provided by us,
Vis mer
— A fast and sensitive multichannel detector system for cathodoluminescence imaging and wavelength analysis with high spatial and spectral resolution. The system must be applicable both to fast routine imaging of real colour variations in, for example, magmatic zircon, as well as to high-resolution imaging. Imaging capability must be demonstrated by satisfactory images of zircon mounts provided by us,
Vis mer
— Capability for whole-thin-section mapping by automatic movement of the stage (minimum range 48 by 28 mm standard thin section).
The instrument should be equipped with a cooling /heating stage capable of working at controlled temperatures between -185 oC and +200 oC
The instrument must be equipped with a Peltier-cooled energy dispersive X-ray spectrometer capable of quantitative as well as qualitative and semiquantitative chemical analysis.
An electron backscatter diffraction detector system should be included as an optional item.
System 2 – Transmission Electron Microscope
The microscope will be used mainly for studies of conventional resin-embedded samples as well as of fully-hydrated and also negatively stained specimens using the following techniques: low and high magnification imaging, medium to high resolution imaging (HREM), imaging at high angles for tomography, low dose imaging of radiation sensitive (cryo-) specimens and energy dispersive X-ray spectroscopy (EDS). We would also like to discuss the possibilities for STEM, phase-plate and energy-loss imaging.
Vis mer
The supply of the transmission electron microscope shall consist of the following:
a. Basic unit;
b. LaB6 gun;
c. Specimen holders: standard holder, high (double)-tilt and possibly rotary (tomography) holder as well as a cryo holder (including pumping station);
d. Digital camera (about 4kX4k);
e. EDS detector;
f. All the necessary computer hardware;
g. All the necessary software (incl. license fees);
h. Closed circuit cooling system;
i. Service contract;
j. Training of personel;
k. Exchange of the existing microscope;
l. Possibility: STEM detector for tomography, phase-plate and possibilities for energy loss imaging.
Estimert verdi eksklusive mva: 8 000 000 💰
12 000 000 💰
Referansenummer: 2014-4407
Utførelsessted
Hovedsted eller utførelsessted: Oslo.

Juridisk, økonomisk, finansiell og teknisk informasjon
Kontraktutførelse
Personalets navn og faglige kvalifikasjoner ✅

Prosedyre
Minste antall kandidater: 3
Største antall kandidater: 4
Objektive utvelgelseskriterier: Best qualified, ref. Qualification document art. 7.1.
Språk
Språk: engelsk 🗣️
Andre språk: Norwegian.

Oppdragsgiver
Identitet
Nasjonalt registreringsnummer: 971035854
Kontakt
Kontaktpunkt: Øivind Martinsen

Referanse
Identifikatorer
Referansenummer tildelt av oppdragsgiver: 2014-4407
Kilde: OJS 2014/S 089-156117 (2014-05-06)
Kunngjøring om tildeling av kontrakt (2015-04-13)
Gjenstand
Anskaffelsens omfang
Totalverdi for anskaffelsen: 13 000 000 💰
Metadata for kunngjøring
Dokumenttype: Kunngjøring om tildeling av kontrakt

Prosedyre
Tilbudstype: Ikke aktuelt

Oppdragsgiver
Identitet
Navn på tildelende myndighet: Universitetet i Oslo
Postadresse: Det matematisk-naturvitenskapelige fakultet, Postboks 1032 Blindern

Referanse
Datoer
Sendt dato: 2015-04-13 📅
Publiseringsdato: 2015-04-17 📅
Identifikatorer
Kunngjøringsnummer: 2015/S 075-132875
Refererer til kunngjøring: 2014/S 89-156117
OJ-S-utgave: 75

Prosedyre
Tildelingskriterier
Kriterium: 1. Technical performance of the instrument (60)
2. Total cost (30)
3. After sales service (10)

Tildeling av kontrakt

1️⃣
Dato for kontraktinngåelse: 2014-10-24 📅
Navn: JEOL Skandinaviska AB
Postadresse: Hammarbäcken 6A
Poststed: Sollentuna
Postnummer: 191 27
Land: Sverige 🇸🇪

2️⃣
Dato for kontraktinngåelse: 2015-03-13 📅
Navn: Spectral Solutions AB
Postadresse: Bredablicksvegen7
Poststed: Lidingö
Postnummer: 181 42
Informasjon om tilbud
Antall mottatte tilbud: 4
2

Oppdragsgiver
Kontakt
URL for dokumenter: https://kgv.doffin.no/ctm/Supplier/Documents/Folder/116621 🌏
Kilde: OJS 2015/S 075-132875 (2015-04-13)
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Leverandører:
JEOL Skandinaviska AB Spectral Solutions AB
Produkter/tjenester:
Laboratorie-, optisk- og presisjonsutstyr... Apparatur til kontroll og prøving Mikroskoper Elektronmikroskoper