2013-8077 Scanning Electron Microscope

Universitetet i Oslo

The main use of the instrument will be imaging along with chemical analysis (however, the chemical analysis is in the tender document entering as an option) of various materials:
- Ranging from isolators, semiconductors to metals
- Small nm-sized particles; magnetic or non-magnetic in nature
- Materials that release organic residues or humidity under the electron beam/vacuum
Typical applications for the instrument will be:
- Imaging of particles (may be magnetic) for size distribution analysis down to some few nm (3-4?), morphology, and chemical analysis
- Evaluation of particles in the range 10-50 nm with a 2-10 nm coating. Chemical composition as well as investigation of coating thickness
- Characterization of thin films (typically 100 nm) deposited onto different substrates (typically Si). Imaging for characterization of film topography as an alternative to AFM, including images of cross-section of broken film substrate. For the latter application, solid contrast between the substrate and the film is crucial
- Imagining of pore structure (< 5-10 nm) of porous insulating materials
For all applications the chemical analysis (EDS) shall at this point be considered as an option.
NOTE: To register your interest in this notice and obtain any additional information please visit the Doffin Web Site at http://www.english.doffin.no/Search/Search_Switch.aspx?ID=299285

Frist
Fristen for mottak av tilbud var 2013-08-14. Anskaffelsen ble publisert 2013-06-28.

Leverandører
Følgende leverandører er nevnt i tildelingsbeslutninger eller andre anskaffelsesdokumenter:

• • Spectral Solutions AB

Hvem?

• • Universitetet i Oslo

Hva?

• • Mikroskoper › Elektronmikroskoper